Atomic-Scale Insights into the Oxidation of Aluminum
| Autor: | Lan Nguyen, Teruo Hashimoto, Dmitri N. Zakharov, Eric A. Stach, Aidan P. Rooney, Benjamin Berkels, George E. Thompson, Sarah J. Haigh, Tim L. Burnett |
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| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: | |
| Zdroj: | ACS applied materials & interfaces 10(3), 2230-2235 (2018). doi:10.1021/acsami.7b17224 Nguyen, L, Hashimoto, T, Zakharov, D N, Stach, E A, Rooney, A P, Berkels, B, Thompson, G, Haigh, S & Burnett, T 2018, ' Atomic-Scale Insights into the Oxidation of Aluminum ', ACS Applied Materials and Interfaces, vol. 10, no. 3, pp. 2230-2235 . https://doi.org/10.1021/acsami.7b17224 ACS Applied Materials & Interfaces |
| Popis: | The surface oxidation of aluminum is still poorly understood despite its vital role as an insulator in electronics, in aluminum-air batteries, and in protecting the metal against corrosion. Here we use atomic resolution imaging in an environmental transmission electron microscope (TEM) to investigate the mechanism of aluminum oxide formation. Harnessing electron beam sputtering we prepare a pristine, oxide-free metal surface in the TEM. This allows us to study, as a function of crystallographic orientation and oxygen gas pressure, the full oxide growth regime from the first oxide nucleation to a complete saturated, few-nanometers-thick surface film. |
| Databáze: | OpenAIRE |
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