Measurement of the energetics of metal film growth on a semiconductor: Ag/Si(100)-(2 x 1)

Autor: D E, Starr, J T, Ranney, J H, Larsen, J E, Musgrove, C T, Campbell
Rok vydání: 2000
Zdroj: Physical review letters. 87(10)
ISSN: 0031-9007
Popis: The first direct calorimetric measurements of the energetics of metal film growth on a semiconductor surface are presented. The heat of adsorption of Ag on Si(100)-(2 x 1) at 300 K decreases from approximately 347 to 246 kJ/mol with coverage in the first monolayer (ML) due to overlap of substrate strain from nearby Ag islands. It then rises quickly toward the bulk sublimation enthalpy (285 kJ/mol) as 3D particles grow. A wetting layer grows to 1.0 ML, but is metastable above approximately 0.55 ML and dewets when kinetics permit. This may be common when adsorbate islands induce a large strain in the substrate surface nearby.
Databáze: OpenAIRE