Autor: |
Linas, Smalakys, Balys, Momgaudis, Robertas, Grigutis, Simonas, Kičas, Andrius, Melninkaitis |
Rok vydání: |
2019 |
Zdroj: |
Optics express. 27(18) |
ISSN: |
1094-4087 |
Popis: |
The decrease of laser-induced damage threshold (LIDT) when exposed with high number of laser pulses is a well-known phenomenon in dielectrics. In the femtosecond regime this fatigue is usually attributed to the incubation of laser-induced lattice defects. In this work, a computational model is used to combine the data from time-resolved digital holographic microscopy measurements together with results of S-on-1 laser-induced damage threshold test in order to investigate fatigue of ZrO |
Databáze: |
OpenAIRE |
Externí odkaz: |
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