| Autor: |
Ian W, Haygood, Eric R J, Edwards, Anna E, Fox, Matthew R, Pufall, Michael L, Schneider, William H, Rippard, Paul D, Dresselhaus, Samuel P, Benz |
| Rok vydání: |
2020 |
| Předmět: |
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| Zdroj: |
IEEE Trans Appl Supercond |
| ISSN: |
1051-8223 |
| Popis: |
The uniformity of the barriers in Josephson junctions (JJs) is a critical parameter in determining performance and operating margins for a wide variety of superconducting electronic circuits. We present an automated measurement system capable of measuring individual JJs across a 1 × 1 cm die at both ambient temperature and 4 K. This technique allows visualization of the spatial variation over a large area of the critical electrical properties of the junctions and allows for the direct correlation between room-temperature (RT) resistance and low temperature properties. The critical current variation of Nb(x)Si(1-x) (x = 15%) barriers is found to be about 2.6% (one standard deviation) for 1024 junctions across an individual die and only weakly correlates with RT resistance measurements. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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