| Autor: |
D V, Kazantsev, C, Dal Savio, K, Pierz, B, Güttler, H-U, Danzebrink |
| Rok vydání: |
2003 |
| Předmět: |
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| Zdroj: |
Journal of microscopy. 209(Pt 3) |
| ISSN: |
0022-2720 |
| Popis: |
A combined system for far- and near-field optical spectroscopy consisting of a compact scanning near-field optical microscope and a dedicated spectrometer was realized. The set-up allows the optical investigation of samples at temperatures from 10 to 300 K. The sample positioning range is as large as 5 x 5 x 5 mm3 and the spatial resolution is in the range of 1.5 micro m in the far-field optical microscopy mode at low temperatures. In the scanning near-field optical microscope mode the resolution is defined by the microfabricated cantilever probe, which is placed in the focus of a double-mirror objective. The tip-to-sample distance in the scanning near-field optical microscope is controlled by a beam deflection system in dynamic scanning force microscopy mode. After a description of the apparatus, scanning force topography images of self-assembled InAs quantum dots on a GaAs substrate with a density of less than one dot per square micrometre are shown, followed by the first spectroscopic investigations of such a sample. The presented results demonstrate the potential of the system. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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