In-Operando Nanoscale X-ray Analysis Revealing the Local Electrical Properties of Rubidium-Enriched Grain Boundaries in Cu(In,Ga)Se

Autor:	Christian T, Plass, Maurizio, Ritzer, Philipp, Schöppe, Sven, Schönherr, Maximilian, Zapf, Martin, Hafermann, Andreas, Johannes, Gema, Martínez-Criado, Jaime, Segura-Ruiz, Roland, Würz, Philip, Jackson, Claudia S, Schnohr, Carsten, Ronning
Rok vydání:	2020
Zdroj:	ACS applied materialsinterfaces. 12(51)
ISSN:	1944-8252
Popis:	Chalcogenide Cu(In,Ga)Se
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=pmid________::7bcfea548519e6dc5b462932d33987df https://pubmed.ncbi.nlm.nih.gov/33306357 Zobrazit plný text záznamu