Structural and morphological data of RF-Sputtered BiVO

Autor: R, Venkatesan, S, Velumani, K, Ordon, M, Makowska-Janusik, G, Corbel, A, Kassiba
Rok vydání: 2017
Předmět:
Zdroj: Data in Brief
ISSN: 2352-3409
Popis: Structural and morphological modulation of rf-sputtered BiVO4 thin films deposited using mechanochemical synthesis prepared BiVO4 nano-powders as sintered target are included in this data article. The crystalline nature of as-prepared films, namely amorphous and crystalline was acquired with time and temperature dependent in-situ high temperature X-ray diffraction (HT-XRD), at a time interval of 1 h. Typical Fourier transform infrared (FT-IR) spectra of annealed thin film of monoclinic BiVO4 structure is given. Furthermore, correlation between morphologies of various substrate temperature fabricated BiVO4 thin films are presented.
Databáze: OpenAIRE