Low-loss TeO

Autor: Henry C, Frankis, Khadijeh Miarabbas, Kiani, Dawson B, Bonneville, Chenglin, Zhang, Samuel, Norris, Richard, Mateman, Arne, Leinse, Nabil D, Bassim, Andrew P, Knights, Jonathan D B, Bradley
Rok vydání: 2019
Zdroj: Optics express. 27(9)
ISSN: 1094-4087
Popis: We report on high-quality tellurium oxide waveguides integrated on a low-loss silicon nitride wafer-scale platform. The waveguides consist of silicon nitride strip features, which are fabricated using a standard foundry process and a tellurium oxide coating layer that is deposited in a single post-processing step. We show that by adjusting the Si
Databáze: OpenAIRE