| Autor: |
N B, Bercu, M, Troyon, M, Molinari |
| Rok vydání: |
2015 |
| Zdroj: |
Journal of microscopy. 263(3) |
| ISSN: |
1365-2818 |
| Popis: |
An original scanning near-field cathodoluminescence microscope for nanostructure characterization has been developed and successfully tested. By using a bimorph piezoelectric stack both as actuator and detector, the developed setup constitutes a real improvement compared to previously reported SEM-based solutions. The technique combines a scanning probe and a scanning electron microscope in order to simultaneously offer near-field cathodoluminescence and topographic images of the sample. Share-force topography and cathodoluminescence measurements on GaN, SiC and ZnO nanostructures using the developed setup are presented showing a nanometric resolution in both topography and cathodoluminescence images with increased sensitivity compared to classical luminescence techniques. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
Plný text