Investigation of SiO

Autor: Dain, Sung, Long, Wen, Hyunwoo, Tak, Hyejoo, Lee, Dongwoo, Kim, Geunyoung, Yeom
Rok vydání: 2022
Zdroj: Materials (Basel, Switzerland). 15(4)
ISSN: 1996-1944
Popis: The etching properties of C
Databáze: OpenAIRE