| Autor: |
Seong, Arim, Kim, Junyoung, Jeong, Donghwi, Sengodan, Sivaprakash, Liu, Meilin, Choi, Sihyuk, Kim, Guntae |
| Jazyk: |
angličtina |
| Rok vydání: |
2021 |
| Předmět: |
|
| Zdroj: |
Adv Sci (Weinh) |
| Popis: |
In article number 2004099, Sihyuk Choi, Guntae Kim, and co‐workers employe the isotope exchange diffusion profile (IEDP) method via time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) to directly trace the proton kinetics on layered perovskite‐type triple conducting oxides (TCOs). This work offers an innovative way to quantify the proton kinetic properties (D(*) (H) and k(*) (H)) of TCOs being a crucial indicator for characterizing the electrochemical behaviour of proton. [Image: see text] |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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