The Dislocation and Correlation Lengths’s Determination of the Ti, Si, Au and ZnO Layers on Ge with the Help of the Peak Profile
| Autor: | Bayal, Özlem, Doğruer, Semih, Öztürk, M. Kemal, Özçelik, Süleyman, Dervişoğlu, H. Celal |
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| Jazyk: | turečtina |
| Rok vydání: | 2018 |
| Databáze: | OpenAIRE |
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