Comparison of Waffle and standard gate pattern base on specific on-resistance

Autor: Vacula, Patrik, Husák, Miroslav
Přispěvatelé: Pihera, Josef, Steiner, František
Jazyk: angličtina
Rok vydání: 2014
Předmět:
Popis: The main goal of this work is to compare the different Waffle MOS structures as function between main dimensions and channel resistance (specific on-resistance). Even if Waffle MOS structure is so general that it is independent on dedicated CMOS process in fact constrains coming from specific CMOS process design rules has main influence on final Waffle MOS shape and final required area. Comparison describing how dimensions of Waffle MOS have influence on channel resistance would be proposed. Due to non-conventional gate geometry of the Waffle MOS transistor compare to the fingers structure, the channel W/L ratio calculation is not trivial and conformal Schwarz-Christoffel Transformation mapping was used.
Databáze: OpenAIRE