| Autor: |
Davydok, A., Biermanns, A., Pietsch, U., Grenzer, J., Paetzelt, H., Gottschalch, V., Bauer, J. |
| Jazyk: |
angličtina |
| Rok vydání: |
2009 |
| Předmět: |
|
| Zdroj: |
Physica Status Solidi (A) 206(2009)8, 1704-1708 |
| ISSN: |
1704-1708 |
| Popis: |
We present spatially resolved X-ray diffraction pattern of individual GaAs nanorods grown catalyst-free throughout a pre-patterned amorphous SiNx mask onto germanium [111] surfaces. The experiment has been performed using synchrotron radiation using a micro-sized beam prepared by compound refractive lenses. Due to the non-polar character of the substrate the shapes of NR´s appear not uniform and vary between deformed hexagonal and trigonal in symmetry. Because the average diameter of NR´s equals the experimental resolution certain cuts through slightly inclined edges or corners of individual nanorods with lateral size of about 225 nm could be selected using spatially resolved reciprocal space mapping. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
