Experimental Study on the Reliability of Low Blocking Voltage Power VDMOSFET During Heavy Ion Exposure
| Autor: | Velardi, Francesco, Iannuzzo, Francesco, Busatto, Giovanni, Wyss, Jeffery, Sanseverino, Annunziata, Candelori, A., Curro', G., Cascio, A., Frisina, F. |
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| Rok vydání: | 2004 |
| Databáze: | OpenAIRE |
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