Electrical aging tests on different nanostructured enamels subjected to severe voltage waveforms8th IEEE Symposium on Diagnostics for Electrical Machines, Power Electronics & Drives
| Autor: | Guastavino, Francesco, Alessandro, Ratto, Torello, Eugenia, Giovanna, Biondi, Giovanni, Loggi, Andrea, Ceci |
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| Jazyk: | angličtina |
| Rok vydání: | 2011 |
| Databáze: | OpenAIRE |
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