Advanced Coherent X-ray Diffraction and Electron Microscopy of Individual InP Nanocrystals on Si Nanotips for III-V-on-Si Electronics and Optoelectronics

Autor:	Niu, Gang, Leake, Steven John, Skibitzki, Oliver, Niermann, Tore, Carnis, Jerome, Kießling, Felix, Hatami, Fariba, Hussein, Emad Hameed, Schubert, Markus Andreas, Zaumseil, Peter, Capellini, Giovanni, Masselink, William Ted, Ren, Wei, Ye, Zuo-Guang, Lehmann, Michael, Schülli, Tobias, Schroeder, Thomas, Richard, Marie-Ingrid
Přispěvatelé:	Niu, Gang, Leake, Steven John, Skibitzki, Oliver, Niermann, Tore, Carnis, Jerome, Kießling, Felix, Hatami, Fariba, Hussein, Emad Hameed, Schubert, Markus Andrea, Zaumseil, Peter, Capellini, Giovanni, Masselink, William Ted, Ren, Wei, Ye, Zuo-Guang, Lehmann, Michael, Schülli, Tobia, Schroeder, Thoma, Richard, Marie-Ingrid
Rok vydání:	2019
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=od______3668::852d039ef7eb91000d8aa49c4615d457 https://hdl.handle.net/11590/352345 Zobrazit plný text záznamu