| Autor: |
P. Radhakrishnan, B. Geisler, K. Fürsich, D. Putzky, Y. Wang, S. E. Ilse, G. Christiani, G. Logvenov, P. Wochner, P. A. van Aken, E. Goering, R. Pentcheva, E. Benckiser |
| Jazyk: |
angličtina |
| Rok vydání: |
2021 |
| Popis: |
Oxide heterostructures provide unique opportunities to modify the properties of quantum materials through a targeted manipulation of spin, charge, and orbital states. Here, we use resonant x-ray reflectometry to probe the electronic structure of thin slabs ofYVO3embedded in a superlattice withLaAlO3. We extend the previously established methods of reflectometry analysis to a general form applicable tot2gelectron systems and extract quantitative depth-dependent x-ray linear dichroism profiles. Our data reveal an artificial, layered orbital polarization, where the average occupation ofxzandyzorbitals in the interface planes next toLaAlO3is inverted compared to the central part of theYVO3slab. This phase is stable down to 30 K and the bulklike orbital ordering transitions are absent. We identify the key mechanism for the electronic reconstruction to be a combination of epitaxial strain and spatial confinement by theLaAlO3layers, in good agreement with predictions fromab initiotheory. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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