| Autor: |
Phillips, D. S., Holesinger, T. G., Phillips D. S., Willis J. O., Peterson D. E., Willis, J. O., Peterson, D. E. |
| Rok vydání: |
1995 |
| Popis: |
The microstructure and phase assemblage of isothermal melt processed (IMP) Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub y} (Bi-2212) thick films have been evaluated. Results from compositional analysis and phase identification indicate that the characteristics of the partial melt greatly influence the microstructural and chemical development of the thick films. The highest critical current densities were obtained in films processed below 800{degrees}C where the partial melt uniformly coats the substrate without excessive phase segregation. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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