Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison
| Autor: | Alfeld, Matthias, Vekemans, Bart, Janssens, Koen, Falkenberg, G., Broekaert, J.A.C., Gao, N., Gibson, D. |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2007 |
| Zdroj: | HASYLAB Jahresbericht 2006 / Schneider, J. [edit.] |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|