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Na področju nanorobotike se za potrebe mikroskopije vse bolj pogosto uporablja AFM metoda. To je metoda mikroskopije, kjer uporabljamo fizikalni efekt Van der Waals-ove sile. AFM nam v navezi z različnimi vrstami sond omogoča izris slike, izris topografije in meritve 3D objekta v nanomerilu. Ena izmed sond, ki se uporablja za to vrsto mikroskopije, je Akiyamo sonda. Slednja je sestavljena iz nihajnih vilic in tipala ter deluje po principu razlike v frekvenci nihanja tipala in zaznavanju sil med sondo in merjenim vzorcem. It is often used an AFM method for purposes of microscop at the field of nanorobotics. This is a method of microscopy that uses so called Van der Waals force. AFM with multiple kinds of probes enables us to draw a picture, to draw topography and measurement of 3D objects in nanoscale. One of the probes that is used for this kind of microscopy is named an Akiyama probe. It's made out of tuning forks and a tip and works at the principle of difference in frequency of swinging tip and perception force between probe and measured sample. |
