| Autor: |
Groza, A.A., Venger, E.F., Varnina, V.I., Holiney, R.Yu., Litovchenko, P.G., Matveeva, L.A., Litovchenko, A.P., Sugakov, V.I., Shmatko, G.G. |
| Jazyk: |
angličtina |
| Rok vydání: |
2001 |
| Předmět: |
|
| Popis: |
Processes of structure defects formation, which accompanied by oxygen precipitation after a neutron irradiation (10¹⁵- 10¹⁹ n/cm²) and high-temperature treatment (800 - 1000°С) in CZ silicon, were investigated by the transmission electron microscopy. Influence of the structure defects on electrooptical properties of silicon was revealed. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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