xD-Reflect - 'Multidimensional Reflectometry for Industry' a research project of the European Metrology Research Program (EMRP)

Autor: Höpe, Andreas, Koo, Annette, Forthmann, Carsten, Verdu, Francisco, Manoocheri, Farshid, Leloup, Frédéric, Obein, Gaël, Wübbeler, Gerd, Ged, Guillaume, Campos, Joaquin, Hauer, Kai-Olaf, Yang, Li, Smid, Marek, Langovoy, Mikhail, Iacomussi, Paola, Jaanson, Priit, Källberg, Stefan
Jazyk: angličtina
Rok vydání: 2014
Předmět:
Popis: The general objective of the xD-Reflect research project is to meet the demands from European industry to measure the overall macroscopic appearance of modern surfaces by developing and improving methods for optical measurements which correlate with the visual sensation being evoked. In particular, the project deals with different attributes of dedicated artefacts, like "Goniochromatism", "Gloss" and "Fluorescence" properties, which will be investigated in three main work packages. Two additional transversal work packages reinforce the structure: "Modelling and Data Analysis" with the objective to give an irreducible set of calibration schemes and handling methods and "Visual Perception", which will produce perception scales for the different visual attributes. ispartof: 12th International Conference on New Developments and Applications in Optical Radiometry (NEWRAD 2014) ispartof: NEWRAD 2014 location:Espoo, Finland date:24 Jun - 27 Jun 2014 status: published
Databáze: OpenAIRE