A New DFT Architecture to Reduce Test Data Volume and Test Application Time

Autor:	Zhang Ling, Kuang Jishun, Mei Junjin
Jazyk:	angličtina
Rok vydání:	2016
Předmět:	test data compression integrated circuits broadcast architecture design for test
Zdroj:	Engineering Review : Međunarodni časopis namijenjen publiciranju originalnih istraživanja s aspekta analize konstrukcija, materijala i novih tehnologija u području strojarstva, brodogradnje, temeljnih tehničkih znanosti, elektrotehnike, računarstva i građevinarstva Volume 36 Issue 3
ISSN:	1849-0433 1330-9587
Popis:	This paper proposes a new DFT Architecture that contains three test scan modes. The test data could be interval broadcast to scan chains whenever the data in corresponding locations are compatible. Compared with the conventional broadcast scan architecture, the proposed architecture achieves better compression ratio in all cases, and the test application time is also induced. The hardware overhead is very low. Both theoretical and experimental results prove efficacy and versatility of the proposed scheme.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=od_______951::98dd528bd3647e7a9fe36b7e96d4d98e https://hrcak.srce.hr/file/244463 Zobrazit plný text záznamu