| Autor: |
Zhilova, O. V., Pankov, S. Yu., Makagonov, V. A., Foshin, V. A., Babkina, I. V. |
| Jazyk: |
ruština |
| Rok vydání: |
2020 |
| Popis: |
It was shown that the change in the electrical resistivity of [(Co40Fe40B20)34(SiO2)66/ZnO]112 films from their thickness is associated with the formation of a multilayer structure and a decrease in the specific number of conductive interface regions with increasing film thickness. Работа была выполнена при поддержке РФФИ (проект № 19-48-360010). |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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