TRANSMISSION ELECTRON MICROSCOPY IN SITU: PHASE-TRANSITIONS, CRYSTAL GROWTH, e-BEAM ANNEALING OF AMORPHOUS FILMS

Autor:	Kolosov, V. Yu.
Jazyk:	angličtina
Rok vydání:	2020
Popis:	In this paper starting from a short review we present our in situ TEM studies of thinfilm transformations initiated by electron beam primarily for initially amorphous layers of several oxides and chalcogen-based materials. Работа выполнена при частичной финансовой поддержке грантов РФФИ 20-02-00906.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=od_______917::794a14a204dcc5a9666d7ff83d0f035d https://hdl.handle.net/10995/96012 Zobrazit plný text záznamu