Nonlinear microscopy using cylindrical vector beams

Autor: Bautista, Godofredo, Kakko, Joona Pekko, Dhaka, Veer, Zang, Xiaorun, Karvonen, Lasse, Jiang, Hua, Kauppinen, Esko, Lipsanen, Harri, Kauranen, Martti
Přispěvatelé: Tampere University of Technology, Department of Electronics and Nanoengineering, Department of Applied Physics, Aalto-yliopisto, Aalto University
Jazyk: angličtina
Rok vydání: 2017
Popis: The three-dimensional (3D) optical fields that arise from the focusing of cylindrical vector beams (CVB) with radial and azimuthal polarizations provide new sources of contrast for optical microscopy of nano-objects. So far, these demonstrations have been restricted to two-dimensional transversal scanning, i.e., along the focal plane of interest, or use of point-like objects, i.e., single molecules and nanoparticles. Here, we demonstrate the first application of CVBs for 3D imaging of 3D nano-objects. This technique is done by acquiring 3D image scans of the second-harmonic generation signal from vertically-aligned semiconductor nanowires, whose second-order response is primarily driven by the longitudinal electric field, i.e., the field component along the nanowire axis. Our technique provides a new way to study individual nano-objects in three dimensions through the unique combination of nonlinear microscopy and CVBs.
Databáze: OpenAIRE