| Autor: |
Rendon-Barraza, Carolina, Chan, Eng Aik, Li, Jinxiang, Liu, Tongjun, MacDonald, Kevin F., Ou, Jun-Yu, Papas, Dimitrios, Papasimakis, Nikitas, Plum, Eric, Pu, Tanchao, Yuan, Guanghui, Zheludev, Nikolai |
| Jazyk: |
angličtina |
| Rok vydání: |
2021 |
| Předmět: |
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| Popis: |
We demonstrate metrology and odometry (detection of change in position over time) with resolution in the nanometric - picometric scales by analyzing electrons or topologically structured light scattered from the nanostructures using artificial intelligence. We show how these techniques can be applied to characterization and optimization of nano-opto-mechanical metamaterials and the fundamental studies of dynamics of thermal motion and the physics of phonons in photonic nanostructures. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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