Nano-optical metrology with phase singularities
| Autor: | Grant, Thomas Alfred, Plum, Eric, MacDonald, Kevin F., Zheludev, Nikolai |
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| Jazyk: | angličtina |
| Rok vydání: | 2023 |
| Popis: | We show how the exploitation of phase singularities in topologically structured light fields can enable dramatic sensitivity improvements in diffraction-based optical displacement and dimensional metrology. |
| Databáze: | OpenAIRE |
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