| Autor: |
Denlinger, JD, Gweon, GH, Allen, JW, Olson, CG, Maple, MB, Sarrao, JL, Armstrong, PE, Fisk, Z, Yamagami, H |
| Jazyk: |
angličtina |
| Rok vydání: |
2001 |
| Zdroj: |
Denlinger, JD; Gweon, GH; Allen, JW; Olson, CG; Maple, MB; Sarrao, JL; et al.(2001). Comparative study of the electronic structure of XRu2Si2: Probing the Anderson lattice. Journal of Electron Spectroscopy and Related Phenomena, 117-118, 347-369. doi: 10.1016/S0368-2048(01)00257-2. UC Irvine: Retrieved from: http://www.escholarship.org/uc/item/2ht823bb |
| Popis: |
The k-resolved single particle excitations, as determined by angle-resolved photoemission spectroscopy (ARPES), are compared and contrasted for, LaRu2Si2, CeRu2Si2, ThRu2Si2, and URu2Si2, isostructural layered compounds with differing nominal f-occupations of f0, f1, f0, and f2, respectively. ARPES measurements include 4d and 5d-edge resonant photoemission to distinguish f-character and Fermi-energy intensity mapping of Fermi surface contours. Comparison to RLAPW band structure calculations shows very good agreement of the d-band structure away from EF. Discrepancies in the near EFregion highlight k-dependent effects of f-correlation and f-d hybridization. Approximately equal dimensions of Fermi contours for X=(La, Ce) suggest the exclusion of 4f electrons from the CeRu2Si2Fermi surface at temperatures far above the Kondo temperature. High-resolution spectra for X=(Ce, U) allow comparison of f-d mixing to predictions of the Anderson lattice model. Published by Elsevier Science B.V. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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