Atomic Scale Interface Structure of In{sub 0.2}Ga{sub 0.8}As/GaAs Strained Layers Studied By Cross-Sectional Scanning Tunneling Microscopy
| Autor: | Zheng, J.F., Salmeron, E.M., Weber, E.R. |
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| Jazyk: | angličtina |
| Rok vydání: | 1993 |
| Zdroj: | Zheng, J.F.; Salmeron, E.M.; & Weber, E.R.(1993). Atomic Scale Interface Structure of In{sub 0.2}Ga{sub 0.8}As/GaAs Strained Layers Studied By Cross-Sectional Scanning Tunneling Microscopy. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/5w69g0k0 |
| Databáze: | OpenAIRE |
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