| Autor: |
White, ER, Kerelsky, Alexander, Hubbard, William A, Dhall, Rohan, Cronin, Stephen B, Mecklenburg, Matthew, Regan, BC |
| Rok vydání: |
2015 |
| Předmět: |
|
| Zdroj: |
Applied physics letters, vol 107, iss 22 |
| Popis: |
Heterostructure devices with specific and extraordinary properties can be fabricated by stacking two-dimensional crystals. Cleanliness at the inter-crystal interfaces within a heterostructure is crucial for maximizing device performance. However, because these interfaces are buried, characterizing their impact on device function is challenging. Here, we show that electron-beam induced current (EBIC) mapping can be used to image interfacial contamination and to characterize the quality of buried heterostructure interfaces with nanometer-scale spatial resolution. We applied EBIC and photocurrent imaging to map photo-sensitive graphene-MoS2 heterostructures. The EBIC maps, together with concurrently acquired scanning transmission electron microscopy images, reveal how a device's photocurrent collection efficiency is adversely affected by nanoscale debris invisible to optical-resolution photocurrent mapping. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
