Scanning Tunneling Microscopy at High Gap Resistances and on Chemically Modified Silicon Surfaces

Autor:	Wilson, T.E., Murray, M.N., Ogletree, D.F., Bednarski, M.D., Cantor, C.R., Salmeron, E.M.
Jazyk:	angličtina
Rok vydání:	1990
Zdroj:	Wilson, T.E.; Murray, M.N.; Ogletree, D.F.; Bednarski, M.D.; Cantor, C.R.; & Salmeron, E.M.(1990). Scanning Tunneling Microscopy at High Gap Resistances and on Chemically Modified Silicon Surfaces. Journal of vacuum science and technology B, 9(2). Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/8w39k929
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=od_______325::7b8db7f30e22be503a6d162c09f07e59 http://www.escholarship.org/uc/item/8w39k929 Zobrazit plný text záznamu