Determination of Surface Recombination Velocity and Bulk Lifetime in Detector Grade Silicon and Germanium Crystals
| Autor: | Derhacobian, N., Fine, P., Luke, P.N., Walton, J.T., Wong, Y.K. |
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| Jazyk: | angličtina |
| Rok vydání: | 1993 |
| Zdroj: | Derhacobian, N.; Fine, P.; Luke, P.N.; Walton, J.T.; & Wong, Y.K.(1993). Determination of Surface Recombination Velocity and Bulk Lifetime in Detector Grade Silicon and Germanium Crystals. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/6qw7w4sq |
| Databáze: | OpenAIRE |
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