Microdefects in Nitrogen Doped Fz Silicon Revealed by Li{sup +} Drifting
| Autor: | Knowlton, W.B., Walton, J.T., Wong, Y.K., Haller, E.E., Ammon, W.V., Zulehner, W. |
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| Jazyk: | angličtina |
| Rok vydání: | 1995 |
| Zdroj: | Knowlton, W.B.; Walton, J.T.; Wong, Y.K.; Haller, E.E.; Ammon, W.V.; & Zulehner, W.(1995). Microdefects in Nitrogen Doped Fz Silicon Revealed by Li{sup +} Drifting. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/7ts964gj |
| Databáze: | OpenAIRE |
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