Scanning Tunneling Microscopy of Si donors in GaAs

Autor:	Zheng, J.F., Liu, X., Newman, N., Weber, E.R., Ogletree, D.F., Salmeron, E.M.
Jazyk:	angličtina
Rok vydání:	1993
Zdroj:	Zheng, J.F.; Liu, X.; Newman, N.; Weber, E.R.; Ogletree, D.F.; & Salmeron, E.M.(1993). Scanning Tunneling Microscopy of Si donors in GaAs. Lawrence Berkeley National Laboratory: Lawrence Berkeley National Laboratory. Retrieved from: http://www.escholarship.org/uc/item/2g07t5zt
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=od_______325::164a3e9c05536f8841d5d63a40560653 http://www.escholarship.org/uc/item/2g07t5zt Zobrazit plný text záznamu