| Autor: |
Pietsch, Ullrich, Gupta, Amod, Paul, A., Meneghini, C., Mibu, K., Maddalena, S., Dal Toe, S., Principi, G. |
| Jazyk: |
angličtina |
| Rok vydání: |
2004 |
| Předmět: |
|
| Popis: |
The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fc interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers. (C) 2004 Elsevier B.V. All rights reserved |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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