Effect of charge fluctuations on the ionic escape rate from a single-site ion channel

Autor:	Kaufman, Igor Kh., Tindjong, R., Luchinsky, Dmitrii G., McClintock, P. V. E.
Jazyk:	angličtina
Rok vydání:	2011
DOI:	10.1007/s00249-011-0734-z
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=od_______201::403762a039e442ccf0a83d54a12b9b06 https://doi.org/10.1007/s00249-011-0734-z Zobrazit plný text záznamu