| Autor: |
Chalupský, J., Krzywinski, J., Juha, L., Hájková, V., Cihelka, J., Burian, T., Vyšín, L., Gaudin, J., Gleeson, A.J., Jurek, M., Khorsand, A.R., Klinger, D., Wabnitz, H., Sobierajski, R., Störmer, M., Tiedtke, K., Toleikis, S. |
| Přispěvatelé: |
XUV Optics |
| Jazyk: |
angličtina |
| Rok vydání: |
2010 |
| Zdroj: |
Optics express, 18(26), 27836-27845. The Optical Society |
| ISSN: |
1094-4087 |
| Popis: |
We present a new technique for the analysis of non-Gaussian laser beams which can not be described by an analytical formula. As a generalization of the beam spot area we apply and extend the definition of so called effective area (Aeff) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which might be misleading for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft x-ray free electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination and their further utilization are presented in this paper |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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