Post-silicon tuning capabilities of 45nm low-power CMOS digital circuits
| Autor: | Meijer, M., Liu, B., Veen, van, R., Pineda de Gyvez, J. |
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| Přispěvatelé: | Electronic Systems |
| Jazyk: | angličtina |
| Rok vydání: | 2009 |
| Předmět: | |
| Zdroj: | Proceedings of 2009 Symposium on VLSI Circuits, 16-18 June 2009, Honolulu, Hawaii, 110-111 STARTPAGE=110;ENDPAGE=111;TITLE=Proceedings of 2009 Symposium on VLSI Circuits, 16-18 June 2009, Honolulu, Hawaii |
| Popis: | Adaptive circuit techniques enable modification of power-performance efficient circuit operation. Yet it is unclear if such techniques remain effective in modern deep-submicron CMOS. In this paper we examine the technological boundaries of supply voltage scaling and body biasing in 45nm low-power CMOS. We demonstrate that there exists an effective tuning range for power-performance and performance variability control. Our analysis is supported by ring oscillator test-chip measurements. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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