Seebeck measurements as a powerful technique to characterize TCO materials
| Autor: | van Helvoort, W.H., Spee, C.I.M.A., Volintiru, I., Sanden, van de, M.C.M., Kuypers, A.D. |
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| Přispěvatelé: | Plasma & Materials Processing |
| Jazyk: | angličtina |
| Rok vydání: | 2006 |
| Zdroj: | Proceedings of the 1st International Symposium on Transparent Conductive Oxides, 23-25 October 2006, Heraklion, Crete, Greece, 204 ENDPAGE=204;TITLE=Proceedings of the 1st International Symposium on Transparent Conductive Oxides, 23-25 October 2006, Heraklion, Crete, Greece |
| Databáze: | OpenAIRE |
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