Optical frequency domain reflectometry for characterization of distributed bragg reflectors
| Autor: | Zhao, D., Pustakhod, D., Augustin, L.M., Bolk, J., Williams, K.A., Leijtens, X.J.M. |
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| Přispěvatelé: | Photonic Integration, NanoLab@TU/e |
| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Zdroj: | Proceedings of the 19th European Conference on Integrated Optics, April 3-5, 2017, Eindhoven, The Netherlands, 1-2 STARTPAGE=1;ENDPAGE=2;TITLE=Proceedings of the 19th European Conference on Integrated Optics, April 3-5, 2017, Eindhoven, The Netherlands |
| Popis: | We present the characterization of the reflection spectra of distributed Bragg reflectors (DBRs) created using DUV scanner lithography in indium-phosphide (InP) with the optical frequency domain reflectometry (OFDR) method. |
| Databáze: | OpenAIRE |
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