Automotive RF immunity test set-up analysis
| Autor: | Coenen, M.J., Pues, H., Bousquet, T., Gillon, R., Gielen, G., Baric, A. |
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| Přispěvatelé: | Integrated Circuits |
| Jazyk: | angličtina |
| Rok vydání: | 2011 |
| Zdroj: | Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia, 71-75 STARTPAGE=71;ENDPAGE=75;TITLE=Proceedings of the 8th Workshop on Electromagnetic, Compatibility of Integrated Circuits 2011 (EMC Compo), November 6-9, Dubrovnik, Croatia |
| Popis: | Though the automotive RF emission and RF immunity requirements are highly justifiable, the application of those requirements in an non-intended manner leads to false conclusions and unnecessary redesigns for the electronics involved. When the test results become too dependent upon the test set-up itself, inter-laboratory comparison as well as the search for design solutions and possible correlation with other measurement methods looses ground. In this paper, the ISO bulk-current injection (BCI) and radiated immunity (RI) module-level tests are discussed together with possible relation to the DPI and TEM cell methods used at the IC level. |
| Databáze: | OpenAIRE |
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