Study on measurement of p-type silicon double quantum dots with FPGA

Autor:	Tashiro, Kouichi, Mizokuchi, Raisei, WEI, HENAN, Wei, Henan, Takahashi, Hiroki, Hirayama, Masaru, Nishiyama, Shimpei, Kodera, Tetsuo
Jazyk:	angličtina
Rok vydání:	2019
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=jairo_______::e2140df7411739354cf91c42927ac288 http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100810846 Zobrazit plný text záznamu