研究速報 : Monolithically Integrated Diode Laser Detection System for Scanning Near-Field Optical Microscopy (SNOM) : VCSEL Technology

Autor: Khalfallah, Sabry, Podlecki, Jean, Nishioka, Masao, Gorecki, Christophe, Kawakatsu, Hideki, Fujita, Hiroyuki, Someya, Takao, Arakawa, Yasuhiko
Jazyk: angličtina
Rok vydání: 1999
Zdroj: 生産研究. 51(8):634-637
ISSN: 0037-105X
Databáze: OpenAIRE