An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits
| Autor: | Wen, Xiaoqing, Yamato, Yuta, Miyase, Kohei, Kajihara, Seiji, Furukawa, Hiroshi, Wang, Laung-Terng, Saluja, Kewal K., Kinoshita, Kozo |
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| Jazyk: | angličtina |
| Rok vydání: | 2006 |
| Předmět: | |
| Zdroj: | 7th Workshop on RTL and High Level Testing (WRTLT`06). :55-60 |
| Popis: | Per-test diagnosis based on the X-fault model is an effective approach for a circuit with physical defects of nondeterministic logic behavior. However, the extensive use of vias and the unpredictable order relation among threshold voltages at fanout branches, both being typical phenomena in a deep-submicron circuit, have not been fully addressed by conventional per-test X-fault diagnosis. To solve these problems, this paper proposes an improved per-test X-fault diagnosis method, featuring (1) an extended X-fault model to handle vias and (2) occurrence probabilities of logic behavior for a physical defect to handle the unpredictable relation among threshold voltages. Experimental result show the effectiveness of the proposed method. 7th Workshop on RTL and High Level Testing (WRTLT`06), November 23-24, 2006, Fukuoka, Japan |
| Databáze: | OpenAIRE |
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