静電浮遊法とX線非弾性散乱法を用いた液体シリコンの原子ダイナミクスの観察

Autor: Masaki, Tadahiko, Ishikawa, Takehiko, Okada, Junpei T., Koike, Noriyuki
Jazyk: japonština
Rok vydání: 2007
Předmět:
Zdroj: 宇宙利用シンポジウム 第23回 平成18年度 = Space Utilization Research: Proceedings of the Twenty-third Space Utilization Symposium. :145-148
Popis: The atomic dynamics in high temperature melts are essential information for the understanding of the relation between liquid structure and thermo-physical properties in liquid state. The small Electrostatic Levitation furnace, ESL, was developed for the inelastic X-ray scattering facility in SPring-8. The observation of dynamic liquid structure factor, S(Q,w) of normal and undercooled liquid silicon was performed. The phonon peak of S(Q,w) in the liquid silicon was clearly observed and its dispersion relation can be obtained.
資料番号: AA0063349039
Databáze: OpenAIRE