RBS Study of the Ni Film and Ni/Si(100) Interface Prepared by Biased dc Sputter-Deposition

Autor: Safran, Gyorgy, Pecz, Bela, Barna, Peter B.
Jazyk: angličtina
Rok vydání: 1994
Zdroj: 電気通信大学紀要 = Bulletin of the University of Electro-Communications. 7(1):41-46
ISSN: 0915-0935
Databáze: OpenAIRE