Backflow Xenon Ions Measurement by Laser-induced Fluorescence Spectroscopy in the Plume of a Microwave Discharge Ion Thruster
| Autor: | INCHINGOLO, Marco Riccardo, SHIRASAWA, Ryota, MORISHITA, Takato, TSUKIZAKI, Ryudo, NISHIYAMA, Kazutaka |
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| Jazyk: | japonština |
| Rok vydání: | 2023 |
| Zdroj: | 令和4年度宇宙輸送シンポジウム: 講演集録 = Proceedings of Space Transportation Symposium FY2022. |
| Popis: | 令和4年度宇宙輸送シンポジウム（2023年1月12日-13日. 宇宙航空研究開発機構宇宙科学研究所（JAXA)(ISAS)) , 相模原市, 神奈川県 Space Transportation Symposium FY2022 (January 12-13, 2023. Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency (JAXA)(ISAS)), Sagamihara, Kanagawa Japan The microwave discharge ion thruster achieved success in some satellite missions, for example, Hayabusa and Hayabusa2. During the development of Hayabusa, endurance tests were conducted coupling the ion source and the cathode for about 20,000 hours. The cathode was also operated in diode mode for more than 80,000 hours in endurance ground tests.In Hayabusa and Hayabusa 2, the cathode is negatively biased in current control mode, and the current is set to be slightly larger than the beam current to ensure the neutralization. However, in orbit the voltage of the cathode increased after only 6,000 hours. The loss of conductivity of the surfaces surrounding the thruster is thought to be one of the possible causes leading to the experienced rising voltage. The surplus electron current is collected at these conductive surfaces, but when ion sputtering wears out the conductive area, increasing the resistivity and making it more difficult for these surfaces to collect electrons. CEX ions are thought to move toward the satellite and to be the main reason of sputtering. These are generated when the high energy ion accelerated by the grids collides with a neutral particle. To prove this hypothesis correct, laser-induced fluorescence spectroscopy was applied to the microwave discharge ion thruster in the region surrounding the cathode and in proximity to the conductive surfaces responsible of surplus electron current collection. This was done for the radial and axial velocitycomponent.. This technique can be used to obtain the ion velocity distribution function (IVDF) by measuring the doppler shift of Xe ions. The data obtained from this study is useful for discussing the contribution of CEX ions to the loss of conductivity surfaces. 資料番号: SA6000184087 STEP-2022-035 |
| Databáze: | OpenAIRE |
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