| Autor: |
YOSHIDA, Shoji, OIGAWA, Haruhiro, TAKEUCHI, Osamu, SHIGEKAWA, Hidemi, Mogi, Hiroyuki, Wang, Zi-Han, Bamba, Takafumi, Takaguchi, Yuhei, Endo, Takahiko, Taninaka, Atsushi, Miyata, Yasumitsu |
| Jazyk: |
angličtina |
| Rok vydání: |
2019 |
| Zdroj: |
Applied physics express. 12(4):045002 |
| ISSN: |
1882-0778 |
| Popis: |
By combining scanning multiprobe (MP) microscopy with optical methods such as light-modulated spectroscopy (LMS) and optical pump-probe (OPP) method, we have succeeded in developing a microscopy method for measuring electronic structures and photoinduced carrier dynamics in microscopic structures. We demonstrated its performance by analyzing the electronic structures in a monolayer island of a WSe2/MoSe2 in-plane heterostructure grown on a SiO2/Si substrate. By observing the field-effect transistor characteristics and photocurrent mapping over the heterostructure by LMS, we were able to visualize the band structure. Positional dependence of carrier dynamics was also successfully probed by OPP-MP spectroscopy. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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